Shanghai Jiepu Technology's reflectance measurement instrument uses the ratio method to determine the spectral reflectance. It is equipped with an imported halogen tungsten lamp that can be used continuously for 2000 hours with a stability of over 99.99%. The reflectance measurement system conducts non-destructive, rapid and high-precision measurements on samples and is applicable for reflectance parameter measurement in multiple industries. It is widely used in measurement solutions for high polymer materials, optical lenses, various crystal plastics and textiles, LED backlight panels and other products.

Reflectance measurement system

1、Adopting advanced spectral measurement technology, it enables rapid full-spectrum reflectance measurement.

2、The light source is composed of high-power halogen lamps, providing a wide-spectrum light source ranging from 400 to 2500nm. The spectral detector is imported from Hamamatsu, Japan, featuring high precision and low noise, with 2048 optical channels, enabling more precise optical measurement.

3、Real-time display of reflectance data and spectral curves for each band from 400 to 1000 nm.

4、Capable of calculating CIE color parameters, XY, LAB,

5、Professional testing software is available, which can set, store and print list data according to actual operation requirements.

6、 The software is equipped with a powerful measurement, analysis and management program, which can be customized according to the customer's requirements to create a measurement plan.

7、Film reflectance detection Reflectance measurement system

It complies with the measurement standards and norms both at home and abroad.

• High resolution, with the minimum resolution of 0. 2nm  (depending on the wavelength range).

• High sensitivity in the UV and VIS bands

• USB, RS232, TTL, 485, Modbus connection interfaces

• Signal-to-noise ratio: 800:1   *snr=(Signal-Noise)/Devication

• Dynamic range: 2000:1   **DR=(saturation/Dark)

• Ultra-low stray light

• Multiple working modes including external trigger, auto exposure and software-controlled exposure.

• Integral time: 8 milliseconds to 65 seconds

• Built-in xenon lamp control circuit

• Supports SDK and is easy to integrate into your system

Data acquisition control software

Spectrum Factory is a professional spectral processing software.

Software support

1、Transmission and reflection mode, the transmission and reflection rate of glass or transparent objects

2、Raman mode, which can be combined with a laser to measure Raman spectra.

3、 Concentration mode, which can be combined with xenon lamps, measures the absorbance at ultraviolet wavelengths, thereby determining the liquid concentration according to Lambert-Beer's Law.

4、Fully automatic motor platform control, supporting single-axis motor, dual-axis motor, three-axis motor, microscope motor, auto-focusing, and camera support. The head supports score display and motion control, such as arc collection and S-shaped acceleration and deceleration.

5、 X-axis timing measurement mode, which can be used in conjunction with mercury-argon lamps to test the stability of the X-axis.

6、Y-axis time sequence measurement mode, which can be combined with the laser to test the stability of the laser's central wavelength.

7、Microscopic mode, which can be combined with the motorized stage, is capable of capturing hyperspectral images, supporting both transmission and reflection hyperspectral imaging, as well as Raman hyperspectral imaging.

8、 LIBS mode can be combined with a 1064 Nd-YAG laser to measure the composition of metals.

9、 Film thickness measurement, capable of measuring the thickness of films ranging from 5um to 100um.

10、Spectrophotometric color measurement can be used to measure parameters such as XYZ, Lab, Yxy, HSV, LCH, and RGB.

11、Online measurement, allowing remote control of the spectrometer's measurement data.

12、Uniformity measurement can test the distribution uniformity of samples, including the uniformity of drug particles or the uniformity of LED light.

Superior stability

As an industrial-grade spectrometer, stability is the most important technical indicator. The overall stability of the instrument is composed of the stability of the spectrometer and the stability of the light source.

Spectral instrument stability

The intensity stability of the spectrometer is over 99.99%.

The wavelength accuracy of the spectrometer is ± 0. 5nm.

Wavelength temperature stability 

wavelength repeatability of the spectrometer.

The stability of halogen lamps is over 99.9%.

Stability test diagram of the complete machine 

It features excellent stability. After 15 minutes of preheating, the stability of the halogen lamp is over 99.9%, and the overall stability of the machine is greater than 99% (as measured over 8 hours).

Microscope with the motorized platform

The VIS3 can be equipped with a microscopic automatic stage to form a microscopic Raman spectroscopy system. With the program, it can achieve Mapping scanning. The precision of the automatic stage is 1um and the repeatability is 2um. When equipped with a microscope, the spot size is 5um.

Hyperspectral imaging

The VIS3 can be equipped with a microscopic automatic platform and, in combination with software algorithms, achieve hyperspectral imaging.

Spectral coordination with motor algorithms to achieve mapping

The principle of reflectance measurement

Principle of Reflectance Measurement

The reflection measurement process

Testing process

1.Turn off the light source and collect the electronic noise of the spectral acquisition equipment

2. Turn on the light source, set the exposure time to 100 ms, place the white board, and collect the reference spectrum.

3. Remove the whiteboard, place the object to be tested, collect the spectral data of the object, with the X-axis representing the spectral wavelength and the Y-axis representing the corresponding reflectance.