Contact: WANG
Mobile: +86-138 0199 7980
Email: klaus@jnewtech.com
Address: Boyang Road16, Build23-A Room207, Shanghai
Trans/Reflect Microscope
- Hightlight:
For Email Quatation
klaus@jnewtech.com
- Introduction
Micro-area transmissivity and reflectivity measurement system is used to measure the reflectivity of the spectrum in tiny area. The integrated halogen tungsten lamp can be used continuously for 2000 hours with a stability of > 99.99%. The reflectivity measurement system performs non-destructive, fast and high-precision measurements on samples. The spot size is 5um (actual measurement), and the transmissivity and reflectivity of small objects can be tested. With an automatic platform, mapping scanning can be performed.
Highlights of the micro-area transmissivity and reflectivity measurement system
1. Using advanced spectral measurement technology, fast full-spectrum reflectivity measurement.
2. The light source is composed of high-power halogen lamps, providing a 400-2500nm wide spectrum light source. The spectrum detector is imported from Hamamatsu, Japan, with high precision and low noise, 2048 optical channels, and more precise optical measurement
3. Real-time display of 350-1000NM reflectivity data and spectral curves in each band.
4. The spot size is 5um, which can measure the transmittance and reflectance of a small area
5. It can calculate CIE color parameters, XY, LAB,
6. The software has built-in powerful measurement analysis management software, which can be customized according to customer requirements
7. Thin film reflectivity detection
Advantages of micro-area transmittance and reflectance measurement system
High resolution, minimum resolution 0.2nm (depending on the wavelength range)
The spot size is 5um, which can measure the transmittance and reflectance of a small area
Built-in objective lens 5x, 20x, 50x, 100x
Signal-to-noise ratio: 800:1 *snr=(Signal-Noise)/Devication
Dynamic range: 2000:1 **DR=(saturation/Dark)
External trigger/auto exposure/software controlled exposure multiple working modes
Integration time 0.06ms-65s
Built-in xenon lamp control circuit
Support SDK, easy to integrate into your system
Reflectivity measurement system specifications
Specfication
VIS3-200-800 | VIS3-350-950 | |
Wavelength | 200-800nm | 350-950nm |
Application | UV-VIS | VIS |
Light Source | Xenon | Halogen lamp |
Optical Channel | 2048 channel,0.3nm min | 2048channel,0.3nm min |
Detector | CMOS,2048 pixel | CMOS,2048 pixel |
Running Mode | Single/Continue/External Trigger | Single/Continue/External Trigger |
Integration Time | 0.06 ms-65m | 0.06 ms-65m |
Slit | 25um / 50um / 100um, 200um | 25um / 50um / 100um, 200um |
Receive Degree | 90 degree | 90 degree |
Light Spot | 0.005mm(50x) | 0.005mm(50x) |
Reflect Range | 0-100% | 0-100% |
Single Acquisition | 0.01s | 0.01s |
Wavelength Accuracy | <0.5nm | <0.5nm |
Repeat of Wavelength | 0.1nm | 0.1nm |
Accuracy | 0.5% | 0.5% |
Repeated Measure | >99.9% | >99.9% |
Moving Platform | X 300mm,Y 300mm,Z 200mm | X 300mm,Y 300mm,Z 200mm |
Platform Accuracy | X-Y 2um | X-Y 2um |
Continue Working | 6 hours | 6 hours |
Mapping Image | Support mapping image | Support mapping image |
Parameter | Reflectance , Transmission, XY,XYZ,LAB,HSV, UVA, UVB, UVC | Reflectance , Transmission, XY,XYZ,LAB,HSV, UVA, UVB, UVC |
Xenon build-in Board | Xenon build-in Board | Xenon build-in Board |
Connector | 30PIN-connector,USB(480Mbps)/ TTL(3.3v)/ RS232 / 485 | 30PIN-connector,USB(480Mbps)/ TTL(3.3v)/ RS232 / 485 |
Integration | Reflectance , Transmission, | Reflectance , Transmission, |
Watchdog | watchdog | watchdog |
Demision | 300 x 185 x 104 mm | 300 x 185 x 104 mm |
Acquisition control software
SpectrumFactory is a professional spectrum processing software
Software support
1. Transflection mode, the transmittance and reflectivity of glass or transparent objects
2. Raman mode, can be combined with laser to measure Raman spectrum
3. Concentration mode, can be combined with xenon lamp to measure the absorbance under ultraviolet wavelength, so as to measure the liquid concentration according to Lambert-Beer law
4. Fully automatic motor platform control, supports one-axis motor, two-axis motor, three-axis motor, microscope motor, autofocus, camera, spectrum display, motion control, such as arc acquisition, S-type acceleration and deceleration, etc.
5. X-axis timing measurement mode, can be combined with mercury argon lamp to test X-axis stability,
6. Y-axis timing measurement mode, can be combined with laser to test laser center wavelength stability
7. Microscope mode, can be combined with motor platform to measure hyperspectral images, support transflection hyperspectral, and Raman hyperspectral
8. LIBS mode, can be combined with 1064 Nd-YAG laser to measure metal composition
9. Film thickness measurement, can measure 5um – 100um film thickness
10. Spectrophotometry, can measure XYZ, Lab, Yxy, HSV, LCH, RGB and other parameters
11. Online measurement, remote control of spectrometer measurement data
12. Uniformity measurement, can test the distribution uniformity of samples, including the uniformity of drug particles, or the uniformity of LED lights
Super strong stability
As an industrial-grade spectrometer, stability is the most important technical indicator. The stability of the whole machine is composed of the stability of the spectrometer + the stability of the light source
Spectrometer stability
Spectrometer light intensity stability > 99.99%
Spectrometer wavelength accuracy +/- 0.5nm
Spectrometer wavelength temperature stability
Spectrometer wavelength repeatability
Halogen lamp stability > 99.9%
Measured stability of the whole machine
Excellent stability. After 15 minutes of preheating, the stability of the halogen lamp is > 99.9%, and the stability of the whole machine is greater than 99% (8 hours of actual measurement)
Microscope and electric platform
Equipped with a microscopic automatic platform, it is combined into a microscopic transmission/reflection spectroscopy system. With the program, it can realize transmission and reflection mapping scanning. The automatic platform has an accuracy of 1um and a repeatability of 2um. Equipped with a microscope, the spot size is 5um
Hyperspectral imaging
vis3 can be equipped with a microscopic automatic platform and combined with software algorithms to achieve hyperspectral imaging. Spectrum with motor algorithm to achieve Mapping
Reflectivity measurement principle
Reflectivity measurement process
Test process
1. Turn off the light source and collect the electronic noise of the spectral equipment
2. Turn on the light source, set the exposure time to 100ms, place the white board, and collect the reference spectrum
3. Remove the white board, place the object to be measured, and collect the spectrum of the object to be measured. The coordinate axis X-axis is the spectrum wavelength, and the Y-axis is the reflectivity corresponding to the wavelength
Application industry:
Can realize textile color detection
Textile fabric transmittance detection, transmittance detection
Polymer material Transmittance detection, transmittance detection, reflectance detection of nanomaterials
Glasses transmittance detection
Semiconductor film thickness detection
LED bulb detection, etc.
More application cases:
Automotive parts micro-area reflectance measurement: https://www.jnewtech.com/?list_165/1274.html
Laser engraving workpiece reflectance measurement: https://www.jnewtech.com/?list_165/1272.html
0.12mm tiny silver wire reflectance: https://www.jnewtech.com/?list_165/1270.html
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Contact
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+86-138 0199 7980
Office hour
Monday to Saturday
Company Phone
13801997980
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